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A compton peak method for incident angle determination in XRF with annular excitation

dc.contributor.authorGreaves, E. D.
dc.contributor.authorSajo Bohus, L.
dc.contributor.authorMarcó, L.
dc.contributor.authorAlvarez, M.
dc.date.accessioned2023-12-03T18:37:01Z
dc.date.available2023-12-03T18:37:01Z
dc.date.issued1992
dc.identifier.citationGreaves, E.D., Bohus, L.S., Marcó, L.M., y Alvarez, M. (1992). A compton peak method for incident angle determination in XRF with annular excitation. X-Ray Spectrometry, 21, 127-131.https://doi.org/10.1002/xrs.1300210306. Corpus ID: 96597273en_US
dc.identifier.urihttps://repositorio.unphu.edu.do/handle/123456789/5390
dc.description.abstractEstablished methods for measuring the incident angle related to XRF when radioisotope annular sources are involved are briefly discussed. As an alternative technique, a direct measurement of the incident angle from the measured spectrum of the Compton scattered energy was developed. Analysing published experimental data, the limit of validity of this new approach is defined and it is established that for the sensitivity determination only the spectral data are required.en_US
dc.language.isoenen_US
dc.publisherX-Ray Spectrometryen_US
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internacional*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.subjectRayos Xen_US
dc.titleA compton peak method for incident angle determination in XRF with annular excitationen_US
dc.typeArticleen_US


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