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dc.contributor.authorSbriz, L.
dc.contributor.authorVillagran, M.
dc.contributor.authorValconi, G.
dc.date.accessioned2023-11-19T15:58:53Z
dc.date.available2023-11-19T15:58:53Z
dc.date.issued1988
dc.identifier.citationSbriz, L., Villagrán, M., y Valconi, G. (1988). Determination of thin surface layers in-situ by the conversion electron mössbauer spectroscopy /CEMS/, using a parallel plate avalanche counter /PPAC/. Journal of Radioanalytical and Nuclear Chemistry, 128, 387-392.https://link.springer.com/article/10.1007/BF02205193O7 , doi 10.1056/NEJM198703263161307en_US
dc.identifier.urihttps://repositorio.unphu.edu.do/handle/123456789/5354
dc.description.abstractIn the present paper we describe a technique for the determination of thin layer thicknesses by the conversion electron Mössbauer spectroscopy /CEMS/, using a new alternative method, a parallel plate avalanche counter /PPAC/, operating with the ketone gas in the ionization chamber. We determined the thickness of iron and magnetite on steel.en_US
dc.language.isoenen_US
dc.publisherJournal of Radioanalytical and Nuclear Chemistryen_US
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internacional*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.subjectEspectroscopía Mössbaueren_US
dc.titleDetermination of thin surface layers in-situ by the conversion electron mössbauer spectroscopy /CEMS/, using a parallel plate avalanche counter /PPAC/en_US
dc.typeArticleen_US


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Attribution-NonCommercial-NoDerivatives 4.0 Internacional
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