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Determination of thin surface layers in-situ by the conversion electron mössbauer spectroscopy /CEMS/, using a parallel plate avalanche counter /PPAC/
(Journal of Radioanalytical and Nuclear Chemistry, 1988)
In the present paper we describe a technique for the determination of thin layer thicknesses by the conversion electron Mössbauer spectroscopy /CEMS/, using a new alternative method, a parallel plate avalanche counter ...
A low-cost LN2 monitor
(American Journal of Physician, 1989)